A world class atomic force microscope (AFM) designed for general educational use. Features include:
- Scan head and sample stage are designed together with strong anti-vibration performance.
- Precision laser detection and probe alignment device makes laser adjustment simple and easy.
- Adjusting servomotor to move the sample approaching tip manually or automatically in order to carry out precision positioning of the scanning area as well as avoid accidental cantilever crash.
- The sample moving device with high-accuracy and large moving range allow to scan any area of the sample.
- Optical observation system for tip checking and sample positioning.
- Modular design of electronic system makes maintenance and further upgrade easily.
- Suspended springs for vibration isolation with good performance.