A world class atomic force microscope (AFM) designed for general educational use. Features include:

  1. Scan head and sample stage are designed together with strong anti-vibration performance.
  2. Precision laser detection and probe alignment device makes laser adjustment simple and easy.
  3. Adjusting servomotor to move the sample approaching tip manually or automatically in order to carry out precision positioning of the scanning area as well as avoid accidental cantilever crash.
  4. The sample moving device with high-accuracy and large moving range allow to scan any area of the sample.
  5. Optical observation system for tip checking and sample positioning.
  6. Modular design of electronic system makes maintenance and further upgrade easily.
  7. Suspended springs for vibration isolation with good performance.

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